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Six Sigma and SPC (Statistical Process Control) Software Applications

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6 Sigma Statistical Process Control (SPC) Software for Windows 95/98/NT/2000/XP/ME

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A B C D E F G H I J K L M N O P Q R S T U V W X Y Z 0-1

A

 

ALT – Accelerated life test

Acceptance sampling plan

Accuracy

Active Redundancy

Affinity chart or diagram

Allocation

Analyze

ANOVA – Analysis of variance

Appraisal cost

AQL – Acceptable Quality Level

Area chart (per FMEA description)

 

B

 

Baseline measures

Bathtub curve

Benchmarking or Benchmark

Black Belt or Blackbelt

Block Diagram

BSC – Balanced scorecard

Burn In

 

C

 

Cause and Effect diagram

Champion / Sponsor

Chi-Square

Common cause

CDR – Concept Design Review

Concept Selection

Complex Block Diagram

Contingency Table

Control

Control chart

Control Plan

Controlled Variation

COPQ – Cost of Poor Quality

Correlation

Correlation Coefficient – Scatter plot

Cp – Inherent process capability

Cpk – Process capability

Critical Characteristic

Criteria matrix

Critical Path Method

Customer requirement

Cycle time

 

D

 

Defect

Defective

Design Life

Design Review

Detection (per FMEA description)

DFSS – Design for Six Sigma

Discrete data

Disposition

Distribution Chart

DMAIC – Define, Measure, Analyze, Improve, Control

DO – Defect opportunity

DOE – Design of Experiments

Downstream

Downtime

DPMO – Defects per Million Opportunities

DPO – Defects per Opportunity

Durability

 

E

 

Effectiveness

Efficiency

Expected life

External failure

 

F

 

FMEA – Failure Mode and Effect Analysis

Failure rate

Fishbone Diagram

Flow Chart

Force field analysis

Frequency Plot

FTA – Fault Tree Analysis

 

G

 

Gantt Chart

Gauge R & R/Gage R & R/GR&R

Green Belt or Greenbelt

 

H

 

Histogram Plot

Hypothesis statement

 

I

 

Improve

Ishikawa Diagram

ISO-9000 or ISO9000

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J

 

Juran Diagram

 

K

 

k Factor

 

L

 

Linear Graph

Loss Function

LASP – Lot acceptance sampling plan

LTPD – Lot tolerance percent defective

LCL – Lower Control Limit

LSL – Lower Specification Limit

 

M

 

MDR – Manufacturing Design Review

Master Black Belt

Mean

MTBF – Mean Time Between Failure

MTTF – Mean Time To Failure

Measure

Multivoting

 

N

 

Non-value adding activity

 

O

 

Operational definition

 

P

 

Parameter

Parameter Design

Pareto Chart

Pareto Principal

Pc – Consumer’s risk

Pilot

PDCA � Plan Do Check Act

PDR – Prototype Design Review

PPDR – Post Production Design Review

Precision

Preliminary plan

Prevention Cost

Probability

Process

Process design

Process improvement

Process management

Process map (flowchart)

PQ – Process Performance Qualification

Proportion defective

Pugh Model

 

Q

 

Quality

QA – Quality assurance

QFD – Quality Function Deployment

Quality inspection

 

R

 

Random sampling

Range – R Bar

R � Reliability

RPN – Risk Priority Number

RQL – Rejectable quality level

R & R Repeatability and Reproducibility

Rework

RTY – Rolled throughput yield

Run chart / time plot

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S

 

Sample

Sampling bias

Scrap

Sigma

Six Sigma or 6 Sigma

Special cause

Standard Deviation

Stratification

Stratified sampling

SPC – Statistical Process Control

Supplier

SIPOC – Suppliers Inputs Process Outputs Customer

Systematic sampling

 

T

 

Tolerance Design

 

U

 

UCL – Upper Control Limit

Uncontrolled Variation

USL – Upper Specification Limit

 

V

 

Value-adding activities

Variable data

Variation

VOC – Voice of the Customer

 

W

 

Weibull Plot

Weibull Distribution

 

X

 

X Bar

 

Y

 

Yield

 

Z

 

Z-Score – Z-Ratio – Z-Value

Zero Defects

 

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Last Updated: Wednesday, 07-Jun-06 21:46:52 PDT


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